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Simulation of high pressure diffraction patterns: details on calculations

Each time you change a parameter, the diffraction patterns are calculated as follow

  • calculate the unit cell volume using pressure and a third order 3d order Birch-Murnagham equation of state.
  • calculate unit cell parameters from the unit cell volume. In this procedure, we keep the axial ratios a/b, a/c and unit cell angles to their zero pressure values.
  • calculate d-spacings for all (hkl) planes in the JCPDS card from the unit cell parameters,
  • for each plane, calculate the diffraction angle 2theta from the d-spacings and experimental wavelength.
  • for each active phase, calculate a synthetic diffraction spectrum assuming a gaussian peak profile with the peak width provided by the user. Intensities from the JCPDS card are scalled by the intensity factor provided by the user.
  • plot the pattern.
  • sort all reflections present in the pattern and put them in the reflection table.

Limitations

  • there are no temperature effects.
  • axial ratios and unit cell angles are not pressure dependent.
  • calculations for triclinic and rhombohedral remain to be implemented.

HPDiff Applet

- homepage
 

File format reference

- JCPDS Card, version 4
- Chi File
 

Info

- Details on calculations
- Including your card in the database
- Changes
Sebastien Merkel, 02/2006
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